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I just got a supposedly new HDD, which shows the following when I run smartctl -x on it:
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 33693 -
# 3 Short offline Completed without error 00% 33604 -
# 4 Short offline Completed without error 00% 26564 -
# 5 Short offline Completed without error 00% 25516 -
# 6 Short offline Completed without error 00% 443 -
# 7 Short offline Completed without error 00% 0 -This sure looks like the HDD was in use, and quite long at that, but then got it's lifetime counter somehow reset.
The rest of the smartctl log looks fine, no errors, no reallocated sectors... but seeing how the lifetime counter was seemingly reset - can I trust that information at all?
Full log below:
smartctl 6.2 2013-07-26 r3841 [x86_64-w64-mingw32-win8.1] (sf-6.2-1)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Ultrastar A7K2000
Device Model: Hitachi HUA722020ALA331
Serial Number: YBKHEW6F
LU WWN Device Id: 5 000cca 221f14c2c
Firmware Version: JKAOA3FD
User Capacity: 2.000.398.934.016 bytes [2,00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Fri Jan 30 14:32:08 2015 WEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (22036) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 367) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 016 - 0
2 Throughput_Performance P-S--- 100 100 054 - 0
3 Spin_Up_Time POS--- 100 100 024 - 0
4 Start_Stop_Count -O--C- 100 100 000 - 1
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
7 Seek_Error_Rate PO-R-- 100 100 067 - 0
8 Seek_Time_Performance P-S--- 100 100 020 - 0
9 Power_On_Hours -O--C- 100 100 000 - 0
10 Spin_Retry_Count PO--C- 100 100 060 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 1
192 Power-Off_Retract_Count -O--CK 100 100 000 - 1
193 Load_Cycle_Count -O--C- 100 100 000 - 1
194 Temperature_Celsius -O---- 214 214 000 - 28 (Min/Max 10/31)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O---K 100 100 000 - 0
198 Offline_Uncorrectable ---R-- 100 100 000 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL R/O 7 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x20 GPL R/O 1 Streaming performance log [OBS-8]
0x21 GPL R/O 1 Write stream error log
0x22 GPL R/O 1 Read stream error log
0x24 GPL R/O 63 Current Device Internal Status Data log
0x80 GPL R/W 63 Host vendor specific log
0x81-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 0 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 33693 -
# 3 Short offline Completed without error 00% 33604 -
# 4 Short offline Completed without error 00% 26564 -
# 5 Short offline Completed without error 00% 25516 -
# 6 Short offline Completed without error 00% 443 -
# 7 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: 10/28 Celsius
Lifetime Min/Max Temperature: 10/31 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/60 Celsius
Min/Max Temperature Limit: -40/70 Celsius
Temperature History Size (Index): 128 (22)
Index Estimated Time Temperature Celsius
23 2015-01-30 12:25 29 **********
24 2015-01-30 12:26 29 **********
25 2015-01-30 12:27 30 ***********
... ..( 52 skipped). .. ***********
78 2015-01-30 13:20 30 ***********
79 2015-01-30 13:21 31 ************
... ..( 33 skipped). .. ************
113 2015-01-30 13:55 31 ************
114 2015-01-30 13:56 30 ***********
115 2015-01-30 13:57 30 ***********
116 2015-01-30 13:58 31 ************
117 2015-01-30 13:59 31 ************
118 2015-01-30 14:00 30 ***********
119 2015-01-30 14:01 31 ************
... ..( 8 skipped). .. ************
0 2015-01-30 14:10 31 ************
1 2015-01-30 14:11 ? -
2 2015-01-30 14:12 31 ************
... ..( 3 skipped). .. ************
6 2015-01-30 14:16 31 ************
7 2015-01-30 14:17 ? -
8 2015-01-30 14:18 11 -
9 2015-01-30 14:19 14 -
10 2015-01-30 14:20 15 -
11 2015-01-30 14:21 17 -
12 2015-01-30 14:22 18 -
13 2015-01-30 14:23 19 -
14 2015-01-30 14:24 20 *
15 2015-01-30 14:25 22 ***
16 2015-01-30 14:26 23 ****
17 2015-01-30 14:27 24 *****
18 2015-01-30 14:28 24 *****
19 2015-01-30 14:29 25 ******
20 2015-01-30 14:30 26 *******
21 2015-01-30 14:31 27 ********
22 2015-01-30 14:32 28 *********
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 1) ==
1 0x008 4 1 Lifetime Power-On Resets
1 0x010 4 0 Power-on Hours
1 0x018 6 0 Logical Sectors Written
1 0x020 6 0 Number of Write Commands
1 0x028 6 1254388 Logical Sectors Read
1 0x030 6 12 Number of Read Commands
3 ===== = = == Rotating Media Statistics (rev 1) ==
3 0x008 4 0 Spindle Motor Power-on Hours
3 0x010 4 0 Head Flying Hours
3 0x018 4 1 Head Load Events
3 0x020 4 0 Number of Reallocated Logical Sectors
3 0x028 4 0 Read Recovery Attempts
3 0x030 4 0 Number of Mechanical Start Failures
4 ===== = = == General Errors Statistics (rev 1) ==
4 0x008 4 0 Number of Reported Uncorrectable Errors
4 0x010 4 1 Resets Between Cmd Acceptance and Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 28 Current Temperature
5 0x010 1 -~ Average Short Term Temperature
5 0x018 1 -~ Average Long Term Temperature
5 0x020 1 31 Highest Temperature
5 0x028 1 10 Lowest Temperature
5 0x030 1 -~ Highest Average Short Term Temperature
5 0x038 1 -~ Lowest Average Short Term Temperature
5 0x040 1 -~ Highest Average Long Term Temperature
5 0x048 1 -~ Lowest Average Long Term Temperature
5 0x050 4 0 Time in Over-Temperature
5 0x058 1 60 Specified Maximum Operating Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 4 Number of Hardware Resets
6 0x010 4 0 Number of ASR Events
6 0x018 4 0 Number of Interface CRC Errors
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 0 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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Yes, it's possible. For some disk models this even happens with a regular firmware update.
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Well, well, well. Looks like I'm being scammed then.
edit: let's say I will run a full read (or write) surface test, will that rediscover all potentially bad sectors (and mark them as such)?
Last edited by Soukyuu (2015-01-30 14:46:49)
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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33693 hours is 3.8 years. That's an awful lot, but it seems it might be a pretty old model. If the drive label indicates date of manufacture, does it jive with the hours?
smartctl 6.2 2013-07-26 r3841 [x86_64-w64-mingw32-win8.1] (sf-6.2-1)Have you checked the drive with current smartctl in Arch? Maybe it's a weird bug in that release.
But whether the Constitution really be one thing, or another, this much is certain - that it has either authorized such a government as we have had, or has been powerless to prevent it. In either case, it is unfit to exist.
-Lysander Spooner
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3.8 years is about right - manufacturing date is Jul 2010. It's an enterprise disk suited for 24/7 use, so such high power on hours is expected I guess. The seller is claiming they were never in use, though, which is clearly false.
I'll try checking it on arch after it finishes the long SMART test (ETA 6h), but I doubt it will change the hours count.
I'm more interested in finding out if the drive is really OK, or just had its SMART info conveniently erased.
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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If you try to return it, keep in mind the seller could have bought in bulk from a wholesaler and was scammed too.
Morality aside, it's actually a pretty good scam. Smartctl is the only utility I've ever used that readily displays a list of past tests with the lifetime hour they were run. Providing the drive is fully functional, someone using the average Windows SMART monitoring utility would never know anything was amiss.
But whether the Constitution really be one thing, or another, this much is certain - that it has either authorized such a government as we have had, or has been powerless to prevent it. In either case, it is unfit to exist.
-Lysander Spooner
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Well, should I return it? Any experience about what the lifetime of an enterprise HDD is?
The long surface scan (using seatools) didn't cause any SMART errors:
smartctl 6.3 2014-07-26 r3976 [x86_64-w64-mingw32-win8.1] (sf-6.3-1)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Ultrastar A7K2000
Device Model: Hitachi HUA722020ALA331
Serial Number: YBKHEW6F
LU WWN Device Id: 5 000cca 221f14c2c
Firmware Version: JKAOA3FD
User Capacity: 2.000.398.934.016 bytes [2,00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Fri Jan 30 21:25:16 2015 WEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (22036) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 367) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 016 - 0
2 Throughput_Performance P-S--- 100 100 054 - 0
3 Spin_Up_Time POS--- 100 100 024 - 0
4 Start_Stop_Count -O--C- 100 100 000 - 2
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
7 Seek_Error_Rate PO-R-- 100 100 067 - 0
8 Seek_Time_Performance P-S--- 100 100 020 - 0
9 Power_On_Hours -O--C- 100 100 000 - 6
10 Spin_Retry_Count PO--C- 100 100 060 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 2
192 Power-Off_Retract_Count -O--CK 100 100 000 - 2
193 Load_Cycle_Count -O--C- 100 100 000 - 2
194 Temperature_Celsius -O---- 130 130 000 - 46 (Min/Max 10/47)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O---K 100 100 000 - 0
198 Offline_Uncorrectable ---R-- 100 100 000 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL R/O 7 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x20 GPL R/O 1 Streaming performance log [OBS-8]
0x21 GPL R/O 1 Write stream error log
0x22 GPL R/O 1 Read stream error log
0x24 GPL R/O 63 Current Device Internal Status Data log
0x80 GPL R/W 63 Host vendor specific log
0x81-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 0 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 33693 -
# 4 Short offline Completed without error 00% 33604 -
# 5 Short offline Completed without error 00% 26564 -
# 6 Short offline Completed without error 00% 25516 -
# 7 Short offline Completed without error 00% 443 -
# 8 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 46 Celsius
Power Cycle Min/Max Temperature: 36/47 Celsius
Lifetime Min/Max Temperature: 10/47 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/60 Celsius
Min/Max Temperature Limit: -40/70 Celsius
Temperature History Size (Index): 128 (51)
Index Estimated Time Temperature Celsius
52 2015-01-30 19:18 46 ***************************
... ..( 93 skipped). .. ***************************
18 2015-01-30 20:52 46 ***************************
19 2015-01-30 20:53 45 **************************
... ..( 17 skipped). .. **************************
37 2015-01-30 21:11 45 **************************
38 2015-01-30 21:12 46 ***************************
... ..( 12 skipped). .. ***************************
51 2015-01-30 21:25 46 ***************************
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 1) ==
1 0x008 4 2 Lifetime Power-On Resets
1 0x010 4 7 Power-on Hours
1 0x018 6 0 Logical Sectors Written
1 0x020 6 0 Number of Write Commands
1 0x028 6 4374861383 Logical Sectors Read
1 0x030 6 33771495 Number of Read Commands
3 ===== = = == Rotating Media Statistics (rev 1) ==
3 0x008 4 7 Spindle Motor Power-on Hours
3 0x010 4 7 Head Flying Hours
3 0x018 4 2 Head Load Events
3 0x020 4 0 Number of Reallocated Logical Sectors
3 0x028 4 21 Read Recovery Attempts
3 0x030 4 0 Number of Mechanical Start Failures
4 ===== = = == General Errors Statistics (rev 1) ==
4 0x008 4 0 Number of Reported Uncorrectable Errors
4 0x010 4 2 Resets Between Cmd Acceptance and Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 45 Current Temperature
5 0x010 1 -~ Average Short Term Temperature
5 0x018 1 -~ Average Long Term Temperature
5 0x020 1 47 Highest Temperature
5 0x028 1 10 Lowest Temperature
5 0x030 1 -~ Highest Average Short Term Temperature
5 0x038 1 -~ Lowest Average Short Term Temperature
5 0x040 1 -~ Highest Average Long Term Temperature
5 0x048 1 -~ Lowest Average Long Term Temperature
5 0x050 4 0 Time in Over-Temperature
5 0x058 1 60 Specified Maximum Operating Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 8 Number of Hardware Resets
6 0x010 4 0 Number of ASR Events
6 0x018 4 0 Number of Interface CRC Errors
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 0 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FISIs that enough to say that the drive is in perfect health (at the moment, at least)?
I've also looked at the drive with a hex editor and it's cleanly zeroed, so they did that part right as well.
I don't think the seller will reply before monday, but I'm kind of interested in what they say.
edit: interesting. Hardware resets count rose from 4 to 8. Can't seem to find what that value means from searching.
Last edited by Soukyuu (2015-01-30 20:34:03)
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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I would expect consumer drives to last about 3 years (more if you're luckey), and enterprise at least 5. If I'm right about enterprise drive life span ou have about 40% of it's life left. In other words return it.
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This is one interesting thread, you only managed to catch that because whoever owned the disk before did smart self-tests, otherwise you would not know as drives usually come with a clean self-test log when new.
Regarding disk health, I would recommend you do a full write test with badblocks and see if any bad blocks are found or if you get any reallocated sectors. All new disks I buy have to cleanly pass this test before I put them into service, it should weed out any disk that has a manufacturing defect or is going to die early. In your case it might help uncover any nasty history that has been hidden by the smart reset.
R00KIE
Tm90aGluZyB0byBzZWUgaGVyZSwgbW92ZSBhbG9uZy4K
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I did a full disc encrypt with TrueCrypt, that should qualify as a "full write test"? Or is badblock doing something special along the way?
Encrypting didn't trigger any errors or sector reallocations. I'm still not going to keep it.
It's one thing if the drive is ~4 years old and another if it has worked those 4 years non-stop.
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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Badblocks writes to the disk, then reads backs and compares with what it wrote. It does this 5 times with different patterns. This is supposed to uncover any possible unreported write errors or stuck bits.
From personal experience I'd say that just because the disk doesn't report any errors or triggers a rellocation it doesn't mean the data was written properly, you need to read it back and confirm it was written properly.
R00KIE
Tm90aGluZyB0byBzZWUgaGVyZSwgbW92ZSBhbG9uZy4K
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Well, I was under the impression that writing to a defective sector would trigger a S.M.A.R.T. sector re-allocation event. Started badblocks, let's see what it says.
Btw, smartctl reports the same power on hours and test log as the windows version.
edit: 1% per 14 minutes. Wow. And that's only the 0xaa test, so 4 days of non-stop use? I think I'll be only doing the one test.
Last edited by Soukyuu (2015-02-01 12:57:28)
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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Are you testing over USB2? I think I made a mistake when I said it would do 5 passes, it's 4 passes. From the man page it says "0xaa, 0x55, 0xff, 0x00" so you end up with a zeroed drive. Last time I tested a 2TB drive it took less than 2 days over USB3. Check with iotop which speed you are getting during the write pass, then you can do some quick math and estimate how long it will take.
Regarding the defective sectors triggering a reallocation, I've had 2 separate cases where badblocks would report problems and I would see problems during use but the counters for the reallocated sectors and reallocation events never changed from zero.
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Tm90aGluZyB0byBzZWUgaGVyZSwgbW92ZSBhbG9uZy4K
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I don't have linux on any PC that has a 3.5" SATA slot, so I'm forced to use an SATA-to-USB2.0 adapter. So yes, I'm limited to ~30MiB/s
It's plodding along, no problems so far @ 26%
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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So you bought a new HDD and it turns out that it's a HDD that's been spinning for 3.8 years, 24x7 of that. Eh, yes, I would return it. Doesn't matter that it's an enterprise disk at all, you didn't buy what you thought you did.
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Yes, I'm sending it back. The seller did not answer anything to my mail asking why the HDD wasn't new, but approved my refund request.
I guess I'll just leave a fitting amazon marketplace review/rating and let amazon handle the rest.
The badblocks run yielded no errors btw, so at least technically, the HDD is in good condition.
edit: Oh and
I think I made a mistake when I said it would do 5 passes, it's 4 passes. From the man page it says "0xaa, 0x55, 0xff, 0x00" so you end up with a zeroed drive.
It's actually 8 passes: it writes the pattern to all sectors, then reads them back and compares, repeating this for each pattern.
Last edited by Soukyuu (2015-02-03 21:46:28)
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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edit: Oh and
R00KIE wrote:I think I made a mistake when I said it would do 5 passes, it's 4 passes. From the man page it says "0xaa, 0x55, 0xff, 0x00" so you end up with a zeroed drive.
It's actually 8 passes: it writes the pattern to all sectors, then reads them back and compares, repeating this for each pattern.
I was counting a pass as write+read as you can't tell if everything is ok until you read the data back.
R00KIE
Tm90aGluZyB0byBzZWUgaGVyZSwgbW92ZSBhbG9uZy4K
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I guess so, I was counting the times it has to travel over the whole disk.
[ Arch x86_64 | linux | Framework 13 | AMD Ryzen™ 5 7640U | 32GB RAM | KDE Plasma Wayland ]
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Soukyuu, can you please send me a private message via my profile (German or Englissh)? I apparently got to the same dealer and if you like I'd discuss some details with you in private, Thanks!
There are 10 types of people: those who understand binary and those who don't.
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