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Hi everyone,
currently, I am not able to boot into my Arch installation. I came across this post in which, based on a few lines from the smartctl output, some users worked out the disk was dead. Sadly, the respective lines in my output of
smartctl -a /dev/sda
(I have got the boot, root, home, and swap partitions on this device) seem to look quite similar to the ones in the linked post, the full output:
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.8.5-arch1-1] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: HGST Travelstar 7K1000
Device Model: HGST HTS721010A9E630
Serial Number: JR10006P2HGTRF
LU WWN Device Id: 5 000cca 7dce3381f
Firmware Version: JB0OA3J0
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Jan 14 22:52:22 2022 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 166) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 071 071 062 Pre-fail Always - 185337071
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 147 147 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 089 089 000 Old_age Always - 17549
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 066 066 000 Old_age Always - 14986
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 7387
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 246
193 Load_Cycle_Count 0x0012 001 001 000 Old_age Always - 1063429
194 Temperature_Celsius 0x0002 222 222 000 Old_age Always - 27 (Min/Max 5/46)
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 4018
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 24
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 14985 hours (624 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 40 c0 08 00 00 Error: UNC at LBA = 0x000008c0 = 2240
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 78 18 88 08 00 40 00 00:03:19.187 READ FPDMA QUEUED
60 08 10 10 3a f1 40 00 00:03:19.187 READ FPDMA QUEUED
60 08 08 08 34 f1 40 00 00:03:19.187 READ FPDMA QUEUED
ea 00 00 00 00 00 a0 00 00:03:19.172 FLUSH CACHE EXT
60 08 e8 00 34 f1 40 00 00:03:16.107 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: electrical failure 60% 14984 0
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Could someone please tell me what the state of my disk is, is it dead, too? Any info/advice would be really appreciated! Please let me know if I should provide output of any other commands.
A bit of the background: about 1.5 months ago, I realized I could not boot into the system and had to boot with a LiveUSB, running partprobe showed that the GPT table was corrupt, I fixed it somehow with gdisk and could then successfully boot into my system, but for some reason it worked terribly slowly and after a while the GPT table ended up corrupted again. On top of this, I kept running into ata error messages when e.g. directly booting the system or booting from a LiveUSB. I have not used the laptop ever since and the other day, when I tried to switch it on, I again had to resort to the LiveUSB, and when I tried to save the backup table with gdisk, it just stalled, so now I just fear to touch anything to not make it worse
Last edited by iamnobody (2022-01-23 01:24:13)
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197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 24
This isn't good, but not necessarily indicates imminent disk failure either - there're especially no re-allocated sectors (yet)
# 1 Short offline Completed: electrical failure 60% 14984 0
Wonky power supply? Loose connection?
the laptop
Battery or AC? Can you circumvent the battery entirely to not make it a factor in the current/voltage?
I'd look at the disk environment first, maybe move it into a different system or an external case (and connec that to a different system)
Try to run a complete smart test and in doubt badblocks (the destructive mode is much faster, but you'll lose all data - you should however secure the valuable data first anyway)
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I have a similar situation here, but the FPDMA errors only occurs with zen and normal kernels, linux-lts doesn't have this issue. And my SSD is fine.
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197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 24
This isn't good, but not necessarily indicates imminent disk failure either - there're especially no re-allocated sectors (yet)
# 1 Short offline Completed: electrical failure 60% 14984 0
Wonky power supply? Loose connection?
the laptop
Battery or AC? Can you circumvent the battery entirely to not make it a factor in the current/voltage?
I'd look at the disk environment first, maybe move it into a different system or an external case (and connec that to a different system)
Try to run a complete smart test and in doubt badblocks (the destructive mode is much faster, but you'll lose all data - you should however secure the valuable data first anyway)
Many thanks for the reply!
Battery or AC? Can you circumvent the battery entirely to not make it a factor in the current/voltage?
AC, I haven't used a battery for a long while now.
I'd look at the disk environment first, maybe move it into a different system or an external case (and connec that to a different system)
Alright, thanks, will do, but this will take some time.
Try to run a complete smart test and in doubt badblocks (the destructive mode is much faster, but you'll lose all data - you should however secure the valuable data first anyway)
Ok, will do this later today and post the outcome here.
UPD: decided to first clone the drive to another one, will run the test once I am done with that
Last edited by iamnobody (2022-01-16 13:17:17)
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Hi @seth, sorry about the delay from my side, I plugged the HDD into another laptop via a SATA USB adapter, copied all the data and ran a long (I presumed that was meant by “complete smart test”) and another short smart test, that is, the tests were run from the laptop I plugged the HDD drive to, not the original laptop. As a note, the laptop was connected to the charger all the time and the battery was in place. Should I remove the battery and run another long test?
The result of
sudo smartctl -a /dev/sda
is below, could you please take a look at it when you have some time?
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-94-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: HGST Travelstar 7K1000
Device Model: HGST HTS721010A9E630
Serial Number: JR10006P2HGTRF
LU WWN Device Id: 5 000cca 7dce3381f
Firmware Version: JB0OA3J0
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Jan 21 01:33:28 2022 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 86) The previous self-test completed having
the electrical element of the test
failed.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 166) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 130 130 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 089 089 000 Old_age Always - 17556
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 066 066 000 Old_age Always - 15034
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 7394
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 246
193 Load_Cycle_Count 0x0012 001 001 000 Old_age Always - 1063504
194 Temperature_Celsius 0x0002 162 162 000 Old_age Always - 37 (Min/Max 5/46)
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 4624
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 24
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 1 occurred at disk power-on lifetime: 14985 hours (624 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 40 c0 08 00 00 Error: UNC at LBA = 0x000008c0 = 2240
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — ———————— ——————————
60 78 18 88 08 00 40 00 00:03:19.187 READ FPDMA QUEUED
60 08 10 10 3a f1 40 00 00:03:19.187 READ FPDMA QUEUED
60 08 08 08 34 f1 40 00 00:03:19.187 READ FPDMA QUEUED
ea 00 00 00 00 00 a0 00 00:03:19.172 FLUSH CACHE EXT
60 08 e8 00 34 f1 40 00 00:03:16.107 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: electrical failure 60% 15034 0
# 2 Extended offline Completed: electrical failure 90% 15028 0
# 3 Extended offline Completed: electrical failure 90% 15026 0
# 4 Short offline Completed: electrical failure 60% 14984 0
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Last edited by iamnobody (2022-01-21 01:15:34)
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To my eye that looks pretty good. It has some hours on it though, is it on 24/7?
Also, the load cycle count is a bit high.
I don't know how to interpret the realacocated event count.
Nothing else looks untoward.
Nothing is too wonderful to be true, if it be consistent with the laws of nature -- Michael Faraday
Sometimes it is the people no one can imagine anything of who do the things no one can imagine. -- Alan Turing
---
How to Ask Questions the Smart Way
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He's not getting rid of the Current_Pending_Sector's and the tests keep failing on "electrical failure" 10% resp. 40% in.
That's not good and unfortunately doesn't seem related to the actual power supply (since the context was changed and also the moment of failure is static)
Lifetime suggests RMA isn't an option. If you've secured all data from the disk and just want to see where it is and whether you can still use it, run badblocks over it and see where this leaves you. Either the disk gives up (rampant sector re-allocation) or the pending sectors will return to 0 and w/ a little luck you can then even complete tests ("electrical failure" is used as generic "uhh-ohh, something™ went wrong but i dunno what" by manufacturers)
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Hi @seth and @ewaller, thank you a lot for your replies and your time!
It has some hours on it though, is it on 24/7?
No, not really, I almost always switch off the laptop at night.
If you’ve secured all data from the disk and just want to see where it is and whether you can still use it, run badblocks over it and see where this leaves you.
Ran it in the non-destructive mode, no bad blocks were found:
$ sudo badblocks -nsv -b 512 -c 65536 /dev/sda
Checking for bad blocks in non-destructive read-write mode
From block 0 to 1953525167
Checking for bad blocks (non-destructive read-write test)
Testing with random pattern: done
Pass completed, 0 bad blocks found. (0/0/0 errors)
But the num of pending sectors indeed got reset to 0:
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-96-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: HGST Travelstar 7K1000
Device Model: HGST HTS721010A9E630
Serial Number: JR10006P2HGTRF
LU WWN Device Id: 5 000cca 7dce3381f
Firmware Version: JB0OA3J0
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Jan 22 18:04:41 2022 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 89) The previous self-test completed having
the electrical element of the test
failed.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 166) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 099 099 062 Pre-fail Always - 131072
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 130 130 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 089 089 000 Old_age Always - 17557
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 066 066 000 Old_age Always - 15052
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 7395
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 246
193 Load_Cycle_Count 0x0012 001 001 000 Old_age Always - 1063521
194 Temperature_Celsius 0x0002 176 176 000 Old_age Always - 34 (Min/Max 5/50)
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 4624
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 1 occurred at disk power-on lifetime: 14985 hours (624 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 40 c0 08 00 00 Error: UNC at LBA = 0x000008c0 = 2240
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — ———————— ——————————
60 78 18 88 08 00 40 00 00:03:19.187 READ FPDMA QUEUED
60 08 10 10 3a f1 40 00 00:03:19.187 READ FPDMA QUEUED
60 08 08 08 34 f1 40 00 00:03:19.187 READ FPDMA QUEUED
ea 00 00 00 00 00 a0 00 00:03:19.172 FLUSH CACHE EXT
60 08 e8 00 34 f1 40 00 00:03:16.107 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: electrical failure 90% 15049 0
# 2 Short offline Completed: electrical failure 60% 15047 0
# 3 Short offline Completed: electrical failure 60% 15035 0
# 4 Short offline Completed: electrical failure 60% 15034 0
# 5 Extended offline Completed: electrical failure 90% 15028 0
# 6 Extended offline Completed: electrical failure 90% 15026 0
# 7 Short offline Completed: electrical failure 60% 14984 0
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
However, as you can see in the output above, I ran another short and long smart test and again ran into electric failures with the same percentage of the tests remaining.
Is there anything else I can do at this point?
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The disks firmware might have a bug that causes the failure of the smart tests.
That's obviously not great, but there's no reason to assume that the disk itself is broken (you'd at least have run into IO errors w/ badblocks)
Usually, when I kinda lose trust in a disk but don't consider it junk, I fill it up with po… cat videos and attach it to a Tv
You could also just continue to use it, just make sure that it's not the exclusive holder of any data or that you critically rely on it ("I'll take this disk into this notebook and onto vacations to work on my novel and store the family pictures there" is maybe not the best of all ideas)
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Gotcha. Just plugged the HDD back into the 1st laptop and fixed the GPT issue again and booted into the system, so far it seems to work just fine. Thank you so much, @seth! Closing the issue.
Last question: what should I keep an eye on in the future as per the output of smartctl -a? The value of Current_Pending_Sector?
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Reallocated_Sector_Ct and Offline_Uncorrectable are the most critical ones. If those keep growing it's a good sign to stop using the disk.
Current_Pending_Sector means that there had been a problem w/ a sector - it might have degraded or there were power supply issues or whatever and you should check the situation because it might turn into an Reallocated_Sector_Ct increase.
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Got it, many thanks again!
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