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#1 2010-12-01 15:00:25

murks
Member
Registered: 2010-12-01
Posts: 5

[SOLVED] S.M.A.R.T. bad, End-to-End_Error

Hi guys,


I've got a small problem I don't know how to handle.
First hint was a message of the BIOS, that S.M.A.R.T. values of one HDD are bad.
So I checked it and got the following:

hdsentinel

HDD Device  1: /dev/sdb
HDD Model ID : SAMSUNG HD103UJ
HDD Serial No: S13PJ1KQ617014
HDD Revision : 1AA01112
HDD Size     : 1032116 MB
Interface    : S-ATA II
Temperature  : 29 °C
Health       : 0 %
Performance  : 100 %
Power on time: 722 days, 11 hours
Est. lifetime: 0 days

smartctl

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD103UJ
Serial Number:    S13PJ1KQ617014
Firmware Version: 1AA01112
User Capacity:    1,000,203,804,160 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Wed Dec  1 15:54:22 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever 
                                        been run.
Total time to complete Offline 
data collection:                 (11962) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine 
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 200) minutes.
Conveyance self-test routine
recommended polling time:        (  21) minutes.
SCT capabilities:              (0x003f) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   077   077   011    Pre-fail  Always       -       7830
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       390
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   097   097   000    Old_age   Always       -       17339
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       307
 13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   001   001   099    Pre-fail  Always   FAILING_NOW 150
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   073   058   000    Old_age   Always       -       27 (Min/Max 13/30)
194 Temperature_Celsius     0x0022   071   058   000    Old_age   Always       -       29 (Min/Max 13/31)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       68935286
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       4
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       2
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Now I don't know, how to fix this.
I would be glad, if I could backup the files on this HDD, but it is not accessable (by normal mounting).

Any idea, how to handle this?

Last edited by murks (2010-12-05 12:29:37)

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#2 2010-12-01 17:27:19

ozar
Member
From: USA
Registered: 2005-02-18
Posts: 1,686

Re: [SOLVED] S.M.A.R.T. bad, End-to-End_Error

I'd say that the current drive is done according to the SMART ouptut.

Can't you install a new drive and then restore your system images and current backups to it?

If you don't have any of those and the platter itself and data on are not damaged, you might be able to have some professional service retrieve the data from it for you.

The only other thing I can think of would be to try a liveCD with TestDisk on it and see if the drive will mount from that and allow you to recover data.


oz

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#3 2010-12-01 17:56:01

lagagnon
Member
From: an Island in the Pacific...
Registered: 2009-12-10
Posts: 1,087
Website

Re: [SOLVED] S.M.A.R.T. bad, End-to-End_Error

As above: backup immediately. Run the Samsung Disk utilities on the Ultimate Boot CD to see if there is any way of repairing the drive - but probably there won't be, but at least that utility might confirm a faulty drive for you.


Philosophy is looking for a black cat in a dark room. Metaphysics is looking for a black cat in a dark room that isn't there. Religion is looking for a black cat in a dark room that isn't there and shouting "I found it!". Science is looking for a black cat in a dark room with a flashlight.

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#4 2010-12-02 16:48:49

murks
Member
Registered: 2010-12-01
Posts: 5

Re: [SOLVED] S.M.A.R.T. bad, End-to-End_Error

Thank you for your replies!

I haven't tried TestDisk yet, but I downloaded UBCD and ran some Samsung tests. Everything was okay, but the surface scan aborted at 96% and showed that there is something wrong. Then I tried to recover the files using UBCD and got it working. Because of that I booted into my Arch system and got the HDD automounted on startup. It seems to be working properly right now.

At the moment I'm copying the needed files from my bad HDD to another smile
After that is done I will test it again. Then I will see, if it works again (not for storing important data, of course) or if it is really done.


Greetings

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#5 2010-12-05 12:29:10

murks
Member
Registered: 2010-12-01
Posts: 5

Re: [SOLVED] S.M.A.R.T. bad, End-to-End_Error

Ok, backup was successful and the HDD is done. It even started to be noisy in a way that I don't trust.

Again thanks for your help, this is solved.

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